Beam scanning using microstrip line on biased ferrite
نویسندگان
چکیده
منابع مشابه
Beam scanning using microstrip line on biased ferrite
The beam scanning properties of a 2-element patch array fed by a microstrip feed situated on a ferrite substrate are presented. Biasing the femte changes the phase length of the microstrip line, scanning the beam by up to 40. The resulting scan loss is -2dB, mainly due to the ferrite becoming lossy as it approaches absorption resonance. Introduction: Ferrite substrates have been the subject of...
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ژورنال
عنوان ژورنال: Electronics Letters
سال: 1997
ISSN: 0013-5194
DOI: 10.1049/el:19970459